Nanostructure characterization by a combined x-ray absorption/scanning force microscopy system

Journal article
(Original article)


Publication Details

Author(s): Pilet N, Raabe J, Stevenson SE, Romer S, Bernard L, Mcneill CR, Fink R, Hug HJ, Quitmann C
Journal: Nanotechnology
Publisher: Institute of Physics: Hybrid Open Access
Publication year: 2012
Volume: 23
Journal issue: 47
ISSN: 0957-4484


Abstract


A combined x-ray transmission and scanning force microscope setup (NanoXAS) recently installed at a dedicated beamline of the Swiss Light Source combines complementary experimental techniques to access chemical and physical sample properties with nanometer scale resolution. While scanning force microscopy probes physical properties such as sample topography, local mechanical properties, adhesion, electric and magnetic properties on lateral scales even down to atomic resolution, scanning transmission x-ray microscopy offers direct access to the local chemical composition, electronic structure and magnetization. Here we present three studies which underline the advantages of complementary access to nanoscale properties in prototype thin film samples. © 2012 IOP Publishing Ltd.



FAU Authors / FAU Editors

Fink, Rainer Prof. Dr.
Professur für Physikalische Chemie


External institutions with authors

Eidgenössische Materialprüfungs- und Forschungsanstalt (Empa) / Swiss Federal Laboratories for Materials Science & Technology
Monash University
Paul Scherrer Institute (PSI)


How to cite

APA:
Pilet, N., Raabe, J., Stevenson, S.E., Romer, S., Bernard, L., Mcneill, C.R.,... Quitmann, C. (2012). Nanostructure characterization by a combined x-ray absorption/scanning force microscopy system. Nanotechnology, 23(47). https://dx.doi.org/10.1088/0957-4484/23/47/475708

MLA:
Pilet, Nicolas, et al. "Nanostructure characterization by a combined x-ray absorption/scanning force microscopy system." Nanotechnology 23.47 (2012).

BibTeX: 

Last updated on 2019-10-04 at 21:50