Nanostructure characterization by a combined x-ray absorption/scanning force microscopy system
Pilet N, Raabe J, Stevenson SE, Romer S, Bernard L, Mcneill CR, Fink R, Hug HJ, Quitmann C (2012)
Publication Type: Journal article, Original article
Publication year: 2012
Journal
Original Authors: Pilet N., Raabe J., Stevenson S.E., Romer S., Bernard L., McNeill C.R., Fink R.H., Hug H.J., Quitmann C.
Publisher: Institute of Physics: Hybrid Open Access
Book Volume: 23
Article Number: 475708
Journal Issue: 47
DOI: 10.1088/0957-4484/23/47/475708
Abstract
A combined x-ray transmission and scanning force microscope setup (NanoXAS) recently installed at a dedicated beamline of the Swiss Light Source combines complementary experimental techniques to access chemical and physical sample properties with nanometer scale resolution. While scanning force microscopy probes physical properties such as sample topography, local mechanical properties, adhesion, electric and magnetic properties on lateral scales even down to atomic resolution, scanning transmission x-ray microscopy offers direct access to the local chemical composition, electronic structure and magnetization. Here we present three studies which underline the advantages of complementary access to nanoscale properties in prototype thin film samples. © 2012 IOP Publishing Ltd.
Authors with CRIS profile
Involved external institutions
Paul Scherrer Institute (PSI)
Switzerland (CH)
Eidgenössische Materialprüfungs- und Forschungsanstalt (Empa) / Swiss Federal Laboratories for Materials Science & Technology
Switzerland (CH)
Monash University
Australia (AU)
Switzerland (CH)
Eidgenössische Materialprüfungs- und Forschungsanstalt (Empa) / Swiss Federal Laboratories for Materials Science & Technology
Switzerland (CH)
Monash University
Australia (AU)
How to cite
APA:
Pilet, N., Raabe, J., Stevenson, S.E., Romer, S., Bernard, L., Mcneill, C.R.,... Quitmann, C. (2012). Nanostructure characterization by a combined x-ray absorption/scanning force microscopy system. Nanotechnology, 23(47). https://dx.doi.org/10.1088/0957-4484/23/47/475708
MLA:
Pilet, Nicolas, et al. "Nanostructure characterization by a combined x-ray absorption/scanning force microscopy system." Nanotechnology 23.47 (2012).
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