Recap of the 2016 DATE Conference & Exhibition

Journal article


Publication Details

Author(s): Fanucci L, Teich J
Journal: IEEE Design and Test of Computers
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Publication year: 2016
Volume: 33
Journal issue: 4
Pages range: 114-117
ISSN: 0740-7475
eISSN: 2168-2356


FAU Authors / FAU Editors

Teich, Jürgen Prof. Dr.-Ing.
Lehrstuhl für Informatik 12 (Hardware-Software-Co-Design)


How to cite

APA:
Fanucci, L., & Teich, J. (2016). Recap of the 2016 DATE Conference & Exhibition. IEEE Design and Test of Computers, 33(4), 114-117. https://dx.doi.org/10.1109/MDAT.2016.2570223

MLA:
Fanucci, Luca, and Jürgen Teich. "Recap of the 2016 DATE Conference & Exhibition." IEEE Design and Test of Computers 33.4 (2016): 114-117.

BibTeX: 

Last updated on 2018-02-07 at 17:23