Employing microspectroscopy to track charge trapping in operating pentacene OFETs

Journal article
(Original article)

Publication Details

Author(s): Rösner B, Zeilmann N, Schmidt U, Fink R
Journal: Organic Electronics
Publisher: Elsevier
Publication year: 2014
Volume: 15
Journal issue: 2
Pages range: 435-440
ISSN: 1566-1199


Ultrathin pentacene films resemble benchmark and model materials for organic field-effect transistors (OFETs). We employ scanning transmission X-ray microspectroscopy (STXM) and confocal Raman microspectroscopy as highly resolving probes to obtain insight into the correlation of morphology and charge transport in pentacene OFETs. By combining the operation-induced intensity increase in Raman-active bands with micromorphology, we are able to visualize charge-induced effects, in particular charge trapping in pentacene OFETs during operation. The high sensitivity and specificity of Raman microscopy allows to distinguish between orientation and charge-induced effects and thus to locate the trapped charges at grain boundaries.© 2013 Elsevier B.V. All rights reserved.

FAU Authors / FAU Editors

Fink, Rainer Prof. Dr.
Professur für Physikalische Chemie
Rösner, Benedikt
Lehrstuhl für Physikalische Chemie II
Zeilmann, Nina Dr.
Lehrstuhl für Physikalische Chemie II

Additional Organisation
Graduiertenkolleg 1896/2 In situ Mikroskopie mit Elektronen, Röntgenstrahlen und Rastersonden
Interdisziplinäres Zentrum, Center for Nanoanalysis and Electron Microscopy (CENEM)

External institutions with authors

WITec Wissenschaftliche Instrumente und Technologie GmbH

How to cite

Rösner, B., Zeilmann, N., Schmidt, U., & Fink, R. (2014). Employing microspectroscopy to track charge trapping in operating pentacene OFETs. Organic Electronics, 15(2), 435-440. https://dx.doi.org/10.1016/j.orgel.2013.12.002

Rösner, Benedikt, et al. "Employing microspectroscopy to track charge trapping in operating pentacene OFETs." Organic Electronics 15.2 (2014): 435-440.


Last updated on 2019-03-06 at 17:18