Employing microspectroscopy to track charge trapping in operating pentacene OFETs

Journal article
(Original article)


Publication Details

Author(s): Rösner B, Zeilmann N, Schmidt U, Fink R
Journal: Organic Electronics
Publisher: Elsevier
Publication year: 2014
Volume: 15
Journal issue: 2
Pages range: 435-440
ISSN: 1566-1199


Abstract


Ultrathin pentacene films resemble benchmark and model materials for organic field-effect transistors (OFETs). We employ scanning transmission X-ray microspectroscopy (STXM) and confocal Raman microspectroscopy as highly resolving probes to obtain insight into the correlation of morphology and charge transport in pentacene OFETs. By combining the operation-induced intensity increase in Raman-active bands with micromorphology, we are able to visualize charge-induced effects, in particular charge trapping in pentacene OFETs during operation. The high sensitivity and specificity of Raman microscopy allows to distinguish between orientation and charge-induced effects and thus to locate the trapped charges at grain boundaries.© 2013 Elsevier B.V. All rights reserved.



FAU Authors / FAU Editors

Fink, Rainer Prof. Dr.
Professur für Physikalische Chemie
Rösner, Benedikt
Lehrstuhl für Physikalische Chemie II
Zeilmann, Nina Dr.
Lehrstuhl für Physikalische Chemie II


Additional Organisation
Graduiertenkolleg 1896/2 In situ Mikroskopie mit Elektronen, Röntgenstrahlen und Rastersonden


External institutions
WITec Wissenschaftliche Instrumente und Technologie GmbH


How to cite

APA:
Rösner, B., Zeilmann, N., Schmidt, U., & Fink, R. (2014). Employing microspectroscopy to track charge trapping in operating pentacene OFETs. Organic Electronics, 15(2), 435-440. https://dx.doi.org/10.1016/j.orgel.2013.12.002

MLA:
Rösner, Benedikt, et al. "Employing microspectroscopy to track charge trapping in operating pentacene OFETs." Organic Electronics 15.2 (2014): 435-440.

BibTeX: 

Last updated on 2019-06-04 at 14:50