Home Publications Research Grants Inventions & Patents Awards Additional Research Activities Faculties & Institutions Research Areas

Complex dewetting scenarios captured by thin-film models

Becker J, Grün G, Seemann R, Manz H, Jacobs K, Mecke K, Blossey R (2003)

---

Publication Type: Journal article, Original article

Publication year: 2003

Journal

Publisher: Nature Publishing Group

Book Volume: 2

Pages Range: 59-63

Journal Issue: 1

DOI: 10.1038/nmat788

Abstract

In the course of miniaturization of electronic and microfluidic devices, reliable predictions of the stability of ultrathin films have a strategic role for design purposes. Consequently, efficient computational techniques that allow for a direct comparison with experiment become increasingly important. Here we demonstrate, for the first time, that the full complex spatial and temporal evolution of the rupture of ultrathin films can be modelled in quantitative agreement with experiment. We accomplish this by combining highly controlled experiments on different film-rupture patterns with computer simulations using novel numerical schemes for thin-film equations. For the quantitative comparison of the pattern evolution in both experiment and simulation we introduce a novel pattern analysis method based on Minkowski measures. Our results are fundamental for the development of efficient tools capable of describing essential aspects of thin-film flow in technical systems.

Authors with CRIS profile

Involved external institutions

How to cite

APA:

Becker, J., Grün, G., Seemann, R., Manz, H., Jacobs, K., Mecke, K., & Blossey, R. (2003). Complex dewetting scenarios captured by thin-film models. Nature Materials, 2(1), 59-63. https://dx.doi.org/10.1038/nmat788

MLA:

Becker, Jürgen, et al. "Complex dewetting scenarios captured by thin-film models." Nature Materials 2.1 (2003): 59-63.

BibTeX: Download