Guiding Genetic Algorithms Using Importance Measures for Reliable Design of Embedded Systems

Conference contribution


Publication Details

Author(s): Aliee H, Vitzethum S, Glaß M, Teich J, Borgonovo E
Publication year: 2016
Conference Proceedings Title: Proceedings of 29th IEEE Symposium on Defect and Fault Tolerance in VLSI and
Pages range: 53-56


FAU Authors / FAU Editors

Aliee, Hananeh
Lehrstuhl für Informatik 12 (Hardware-Software-Co-Design)
Glaß, Michael Prof. Dr.-Ing.
Lehrstuhl für Informatik 12 (Hardware-Software-Co-Design)
Teich, Jürgen Prof. Dr.-Ing.
Lehrstuhl für Informatik 12 (Hardware-Software-Co-Design)


How to cite

APA:
Aliee, H., Vitzethum, S., Glaß, M., Teich, J., & Borgonovo, E. (2016). Guiding Genetic Algorithms Using Importance Measures for Reliable Design of Embedded Systems. In Proceedings of 29th IEEE Symposium on Defect and Fault Tolerance in VLSI and (pp. 53-56). Connecticut, US.

MLA:
Aliee, Hananeh, et al. "Guiding Genetic Algorithms Using Importance Measures for Reliable Design of Embedded Systems." Proceedings of the 29th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Connecticut 2016. 53-56.

BibTeX: 

Last updated on 2018-19-04 at 03:37