Failure by Design: Influence of the RTOS Interface on Memory Fault Resilience

Conference contribution


Publication Details

Author(s): Hoffmann M, Dietrich C, Lohmann D
Publication year: 2013
Conference Proceedings Title: Proceedings of the 2nd GI Workshop on Software-Based Methods for Robust Embedded Systems (SOBRES '13)
Pages range: -


FAU Authors / FAU Editors

Dietrich, Christian
Lehrstuhl für Informatik 4 (Verteilte Systeme und Betriebssysteme)
Hoffmann, Martin
Lehrstuhl für Informatik 4 (Verteilte Systeme und Betriebssysteme)
Lohmann, Daniel PD Dr.
Lehrstuhl für Informatik 4 (Verteilte Systeme und Betriebssysteme)


How to cite

APA:
Hoffmann, M., Dietrich, C., & Lohmann, D. (2013). Failure by Design: Influence of the RTOS Interface on Memory Fault Resilience. In Proceedings of the 2nd GI Workshop on Software-Based Methods for Robust Embedded Systems (SOBRES '13) (pp. -). Koblenz, Germany, DE.

MLA:
Hoffmann, Martin, Christian Dietrich, and Daniel Lohmann. "Failure by Design: Influence of the RTOS Interface on Memory Fault Resilience." Proceedings of the Informatik 2013, Koblenz, Germany 2013. -.

BibTeX: 

Last updated on 2018-19-04 at 02:52