Line shape of near infrared DFB and VCSEL diode lasers under the influence of back reflections

Lins B, Engelbrecht R, Zinn P, Buchtal R, Schmauß B (2011)

Publication Language: English

Publication Type: Conference contribution

Publication year: 2011

Conference Proceedings Title: 8th International Conference on Tunable Diode Laser Spectroscopy, TDLS 2011

Event location: Zermatt, Switzerland CH

DOI: 10.1007/s00340-012-5097-3

Authors with CRIS profile

Bastian Lins Lehrstuhl für Technische Thermodynamik Rainer Engelbrecht Lehrstuhl für Hochfrequenztechnik Bernhard Schmauß Professur für Hochfrequenztechnik mit dem Schwerpunkt Optische Hochfrequenztechnik und Photonik

Involved external institutions

Drägerwerk AG & Co. KGaA DE Germany (DE)

How to cite

APA:

Lins, B., Engelbrecht, R., Zinn, P., Buchtal, R., & Schmauß, B. (2011). Line shape of near infrared DFB and VCSEL diode lasers under the influence of back reflections. In 8th International Conference on Tunable Diode Laser Spectroscopy, TDLS 2011. Zermatt, Switzerland, CH.

MLA:

Lins, Bastian, et al. "Line shape of near infrared DFB and VCSEL diode lasers under the influence of back reflections." Proceedings of the 8th International Conference on Tunable Diode Laser Spectroscopy, TDLS 2011, Zermatt, Switzerland 2011.

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