Photoluminescence topography of fluorescent SiC and its corresponding source crystals

Wilhelm M, Kaiser M, Jokubavicius V, Syväjärvi M, Ou Y, Ou H, Wellmann P (2013)


Publication Language: English

Publication Status: Published

Publication Type: Journal article, Original article

Publication year: 2013

Journal

Publisher: Trans Tech Publications

City/Town: Switzerland

Book Volume: 740-742

Pages Range: 421-424

Conference Proceedings Title: Materials Science Forum (Volumes 740-742)

Event location: St. Petersburg RU

DOI: 10.4028/www.scientific.net/MSF.740-742.421

Abstract

The preparation and application of co-doped polycrystalline SiC as source in sublimation growth of fluorescent layers is a complex topic. Photoluminescence topographies of luminescent 6H-SiC layers and their corresponding source crystals have been studied in order to investigate the dependence of the epitaxial growth on the source material. It is shown that the homogeneity concerning the dopant incorporation and the layer luminescence intensity does not depend on the characteristics of the PVT grown source material. Therefore co-doped polycrystalline SiC is a promising source material in fast sublimation growth of luminescent 6H-SiC.

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How to cite

APA:

Wilhelm, M., Kaiser, M., Jokubavicius, V., Syväjärvi, M., Ou, Y., Ou, H., & Wellmann, P. (2013). Photoluminescence topography of fluorescent SiC and its corresponding source crystals. Materials Science Forum, 740-742, 421-424. https://dx.doi.org/10.4028/www.scientific.net/MSF.740-742.421

MLA:

Wilhelm, Martin, et al. "Photoluminescence topography of fluorescent SiC and its corresponding source crystals." Materials Science Forum 740-742 (2013): 421-424.

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