High-Precision Interferometric Radar for Sheet Thickness Monitoring

Beitrag in einer Fachzeitschrift
(Originalarbeit)


Details zur Publikation

Autor(en): Mann S, Will C, Reißland T, Lurz F, Lindner S, Linz S, Weigel R, Kölpin A
Zeitschrift: IEEE Transactions on Microwave Theory and Techniques
Verlag: IEEE
Jahr der Veröffentlichung: 2018
Band: 66
Heftnummer: 6
Seitenbereich: 3153-3166
ISSN: 0018-9480
Sprache: Englisch


Abstract


Contact-less sensing plays an important role in today’s highly automated industrial environment, as modern sensors allow for an increased product quality in high-speed manufacturing lines. Hereby, a measurement system for sheet thickness monitoring in aluminum and steel rolling mills is presented. The presented concept is based on a differential measurement principle using two cooperating six-port radar systems. The radio frequency front-ends are designed in a high density substrate integrated waveguide technology at a frequency of 61 GHz. Furthermore, a detailed analysis of non-ideal behavior of mono-static six-port radar front-ends is presented. Moreover, the measurement principle is evaluated in a simplified measurement setup and the results are compared to previously presented theory. Finally, an overview of modern sensing technology for steel rolling mills is presented and compared to the proposed measurement system considering the important aspects, i.e. update rate, precision, and thickness limit.


FAU-Autoren / FAU-Herausgeber

Kölpin, Alexander PD Dr.
Lehrstuhl für Technische Elektronik
Lindner, Stefan
Lehrstuhl für Technische Elektronik
Linz, Sarah
Lehrstuhl für Technische Elektronik
Lurz, Fabian
Lehrstuhl für Technische Elektronik
Mann, Sebastian
Lehrstuhl für Technische Elektronik
Reißland, Torsten
Lehrstuhl für Technische Elektronik
Weigel, Robert Prof. Dr.-Ing.
Lehrstuhl für Technische Elektronik
Will, Christoph
Lehrstuhl für Technische Elektronik


Zitierweisen

APA:
Mann, S., Will, C., Reißland, T., Lurz, F., Lindner, S., Linz, S.,... Kölpin, A. (2018). High-Precision Interferometric Radar for Sheet Thickness Monitoring. IEEE Transactions on Microwave Theory and Techniques, 66(6), 3153-3166. https://dx.doi.org/10.1109/TMTT.2018.2825328

MLA:
Mann, Sebastian, et al. "High-Precision Interferometric Radar for Sheet Thickness Monitoring." IEEE Transactions on Microwave Theory and Techniques 66.6 (2018): 3153-3166.

BibTeX: 

Zuletzt aktualisiert 2019-03-01 um 17:38