Determination of laser beam focus position based on secondary speckles pattern analysis

Journal article
(Original article)


Publication Details

Author(s): Alexeev I, Wu J, Karg M, Zalevsky Z, Schmidt M
Journal: Applied Optics
Publication year: 2017
Volume: 56
Journal issue: 26
Pages range: 7413-7418
ISSN: 2155-3165
Language: English


Abstract


Proper positioning of a laser beam focus is a universal problem for various applications that does not have a universal solution. Quite often the taken approach relies on some sort of a calibration and temporal stability of the laser and the optical train. While such an approach can be suitable for a large number of applications its applicability becomes limited in the cases where the laser beam properties uncontrollably change with time. The latter can occur due to the thermal effects, for example. In those cases, the laser focus positioning method should include direct analysis of the laser beam properties. In this contribution we present a simple optical method based on the secondary speckles pattern analysis suitable for determination of the absolute focal spot position. The method does not require any a priori knowledge of the laser beam properties and is suitable for various diffuse or partially diffuse surfaces of interest.



FAU Authors / FAU Editors

Alexeev, Ilya
Lehrstuhl für Photonische Technologien
Karg, Michael
Lehrstuhl für Photonische Technologien
Schmidt, Michael Prof. Dr.-Ing.
Lehrstuhl für Photonische Technologien


Additional Organisation
Lehrstuhl für Photonische Technologien
Erlangen Graduate School in Advanced Optical Technologies
Sonderforschungsbereich 814 Additive Fertigung
Zentralinstitut für Neue Materialien und Prozesstechnik


How to cite

APA:
Alexeev, I., Wu, J., Karg, M., Zalevsky, Z., & Schmidt, M. (2017). Determination of laser beam focus position based on secondary speckles pattern analysis. Applied Optics, 56(26), 7413-7418. https://dx.doi.org/https://doi.org/10.1364/AO.56.007413

MLA:
Alexeev, Ilya, et al. "Determination of laser beam focus position based on secondary speckles pattern analysis." Applied Optics 56.26 (2017): 7413-7418.

BibTeX: 

Last updated on 2018-19-04 at 04:19