Beam Profile Deformation of Fs-Laser Pulses During Electro-optic Scanning with KTN Crystals

Journal article


Publication Details

Author(s): Bechtold P, Bauer D, Schmidt M
Journal: Physics Procedia
Publisher: Elsevier BV
Publication year: 2012
Volume: 39
Pages range: 683-692
ISSN: 1875-3892
eISSN: 1875-3884
Language: English


FAU Authors / FAU Editors

Bauer, Dominik
Lehrstuhl für Photonische Technologien
Bechtold, Peter
Lehrstuhl für Photonische Technologien
Schmidt, Michael Prof. Dr.-Ing.
Lehrstuhl für Photonische Technologien


Additional Organisation
Erlangen Graduate School in Advanced Optical Technologies


How to cite

APA:
Bechtold, P., Bauer, D., & Schmidt, M. (2012). Beam Profile Deformation of Fs-Laser Pulses During Electro-optic Scanning with KTN Crystals. Physics Procedia, 39, 683-692. https://dx.doi.org/10.1016/j.phpro.2012.10.089

MLA:
Bechtold, Peter, Dominik Bauer, and Michael Schmidt. "Beam Profile Deformation of Fs-Laser Pulses During Electro-optic Scanning with KTN Crystals." Physics Procedia 39 (2012): 683-692.

BibTeX: 

Last updated on 2018-28-07 at 20:10