Characterization of a fast gas analyzer based on Raman scattering for the analysis of synthesis gas

Journal article


Publication Details

Author(s): Eichmann S, Weschta M, Kiefer J, Seeger T, Leipertz A
Journal: Review of Scientific Instruments
Publisher: American Institute of Physics (AIP)
Publication year: 2010
Volume: 81
Journal issue: 12
Pages range: 125104
ISSN: 0034-6748
eISSN: 1089-7623
Language: English


Abstract


A sensor system for fast analysis of synthesis gas (mixtures of CO and H2) is proposed and characterized. The system is based on spontaneous Raman scattering, which enables simultaneous concentration measurements of all relevant species. For typical synthesis gas applications, this system has to face large variations of temperature and pressure. In addition, strong fluctuations in mixture composition may occur, which lead to rather inconvenient signal intensities. In this paper, we describe a low resolution spectrometer designed to function as a synthesis gas sensor and characterize pressure and temperature effects on concentration measurements. In addition, the use of different spectral ranges and calibration strategies is investigated in view of measurement accuracy and precision. © 2010 American Institute of Physics.



FAU Authors / FAU Editors

Eichmann, Simone
Lehrstuhl für Technische Thermodynamik
Leipertz, Alfred Prof. Dr.-Ing.
Lehrstuhl für Technische Thermodynamik
Seeger, Thomas Prof. Dr.-Ing.
Lehrstuhl für Technische Thermodynamik
Weschta, Martin
Lehrstuhl für Konstruktionstechnik


Additional Organisation
Erlangen Graduate School in Advanced Optical Technologies


External institutions with authors

University of Aberdeen


How to cite

APA:
Eichmann, S., Weschta, M., Kiefer, J., Seeger, T., & Leipertz, A. (2010). Characterization of a fast gas analyzer based on Raman scattering for the analysis of synthesis gas. Review of Scientific Instruments, 81(12), 125104. https://dx.doi.org/10.1063/1.3521397

MLA:
Eichmann, Simone, et al. "Characterization of a fast gas analyzer based on Raman scattering for the analysis of synthesis gas." Review of Scientific Instruments 81.12 (2010): 125104.

BibTeX: 

Last updated on 2019-17-01 at 09:32