Shading correction for grating-based differential phase contrast X-ray imaging

Conference contribution
(Conference Contribution)


Publication Details

Author(s): Käppler S, Wandner J, Weber T, Maier A, Anton G, Hornegger J, Rieß C
Publisher: Institute of Electrical and Electronics Engineers Inc.
Publication year: 2016
ISBN: 9781479960972


Abstract


Grating-based differential phase-contrast X-ray is a novel imaging modality with excellent soft-tissue contrast. Besides standard X-ray attenuation, it provides complementary information on the differential phase shift and the dark-field signal, which reveals structure variations at (sub-)micron scale. Current experimental setups suffer from a narrow field of view of 2-4cm. Thus, multiple exposures have to be stitched together to image larger objects. However, individual exposures are inherently affected by intensity variations, such that tiling artifacts corrupt the stitched projection. These artifacts are most severe in the differential phase image and highly impact their diagnostic value. To address this issue, we propose a novel optimization-based algorithm for fully compensating these tiling artifacts. Our algorithm estimates a smooth bias field for each individual exposure with a global objective function that minimizes the intensity distortion within and across different tiles in the projection. Compared to a currently widely used heuristic, our algorithm leverages the information available from all exposures to estimate the individual bias fields. The evaluation shows the superiority of the proposed algorithm, as it produces bias-free images. To our knowledge, this is the first bias correction algorithm for differential phase images that yields images with nearly imperceptible transitions between individual exposures.



FAU Authors / FAU Editors

Anton, Gisela Prof. Dr.
Lehrstuhl für Experimentalphysik (Teilchen- und Astroteilchenphysik)
Hornegger, Joachim Prof. Dr.-Ing.
Lehrstuhl für Informatik 5 (Mustererkennung)
Käppler, Sebastian
Lehrstuhl für Informatik 5 (Mustererkennung)
Maier, Andreas Prof. Dr.-Ing.
Lehrstuhl für Informatik 5 (Mustererkennung)
Rieß, Christian Dr.-Ing.
Lehrstuhl für Informatik 5 (Mustererkennung)
Wandner, Johannes
Lehrstuhl für Experimentalphysik (Teilchen- und Astroteilchenphysik)
Weber, Thomas Dr.
Lehrstuhl für Experimentalphysik (Teilchen- und Astroteilchenphysik)


How to cite

APA:
Käppler, S., Wandner, J., Weber, T., Maier, A., Anton, G., Hornegger, J., & Rieß, C. (2016). Shading correction for grating-based differential phase contrast X-ray imaging. Institute of Electrical and Electronics Engineers Inc..

MLA:
Käppler, Sebastian, et al. "Shading correction for grating-based differential phase contrast X-ray imaging." Proceedings of the IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2014 Institute of Electrical and Electronics Engineers Inc., 2016.

BibTeX: 

Last updated on 2018-19-04 at 03:26