SPI - A System Model for Heterogeneously Specified Embedded Systems

Teich J, Ernst R, Richter K, Thiele L, Ziegenbein D (2002)

Publication Type: Journal article

Publication year: 2002

Journal

IEEE Transactions on Very Large Scale Integration (Vlsi) Systems Institute of Electrical and Electronics Engineers (IEEE)

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Book Volume: 10

Pages Range: 379-389

Journal Issue: 4

DOI: 10.1109/TVLSI.2002.807767

Abstract

Embedded systems typically include reactive and transformative functions, often described in different languages and semantics which are well established in their respective application domains. Additionally, a large part of the system functionality and components is reused from previous designs including legacy code. There is little hope that a single language will replace this heterogeneous set of languages. A design process must be able to bridge the semantic differences for verification and synthesis and should account for limited knowledge of system properties. This paper presents the system property intervals (SPI) model, which employs behavioral intervals and process modes to allow the common representation of different languages and semantics. This model is the basis of a workbench which is targeted at the design of heterogeneously specified embedded systems.

Authors with CRIS profile

Jürgen Teich Lehrstuhl für Informatik 12 (Hardware-Software-Co-Design)

Involved external institutions

Technische Universität Braunschweig

Germany (DE) Eidgenössische Technische Hochschule Zürich (ETHZ) / Swiss Federal Institute of Technology in Zurich

Switzerland (CH)

How to cite

APA:

Teich, J., Ernst, R., Richter, K., Thiele, L., & Ziegenbein, D. (2002). SPI - A System Model for Heterogeneously Specified Embedded Systems. IEEE Transactions on Very Large Scale Integration (Vlsi) Systems, 10(4), 379-389. https://dx.doi.org/10.1109/TVLSI.2002.807767

MLA:

Teich, Jürgen, et al. "SPI - A System Model for Heterogeneously Specified Embedded Systems." IEEE Transactions on Very Large Scale Integration (Vlsi) Systems 10.4 (2002): 379-389.

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