Lindlein N (1994)
Publication Type: Journal article
Publication year: 1994
Publisher: Society of Photo-optical Instrumentation Engineers (SPIE)
Book Volume: 33
Pages Range: 2680-2686
A shearing interferometer is proposed for the characterization of microlenses. The optical configuration of the test system enables the measurement of the wave aberrations, the focal length, and the deviations of the lens surface from an ideal sphere. In addition, a quantitative evaluation method is given that enables the calculation of the wave aberrations (e.g., the phase function) from the shearing interferometer data.
APA:
Lindlein, N. (1994). Characterization of microlenses using a phase-shifting shearing interferometer. Optical Engineering, 33, 2680-2686.
MLA:
Lindlein, Norbert. "Characterization of microlenses using a phase-shifting shearing interferometer." Optical Engineering 33 (1994): 2680-2686.
BibTeX: Download