Vila-Comamala J, Jefimovs K, Raabe J, Pilvi T, Fink R, Senoner M, Maassdorf A, Ritala M, David C (2010)
Publication Type: Journal article, Erratum
Publication year: 2010
Original Authors: Vila-Comamala J., Jefimovs K., Raabe J., Pilvi T., Fink R.H., Senoner M., Maassdorf A., Ritala M., David C.
Publisher: Elsevier
Book Volume: 110
Journal Issue: 2
DOI: 10.1016/j.ultramic.2009.11.012
APA:
Vila-Comamala, J., Jefimovs, K., Raabe, J., Pilvi, T., Fink, R., Senoner, M.,... David, C. (2010). Erratum to "advanced thin film technology for ultrahigh resolution X-ray microscopy" [Ultramicroscopy 109 (2009) 1360-1364] (DOI:10.1016/j.ultramic.2009.07.005). Ultramicroscopy, 110(2). https://doi.org/10.1016/j.ultramic.2009.11.012
MLA:
Vila-Comamala, Joan, et al. "Erratum to "advanced thin film technology for ultrahigh resolution X-ray microscopy" [Ultramicroscopy 109 (2009) 1360-1364] (DOI:10.1016/j.ultramic.2009.07.005)." Ultramicroscopy 110.2 (2010).
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