Wierschem A, Niedernostheide FJ, Gorbatyuk A, Purwins HG (1995)
Publication Type: Journal article, Original article
Publication year: 1995
Publisher: Wiley-Blackwell: No OnlineOpen
Book Volume: 17
Pages Range: 106116
Journal Issue: 2
URI: http://onlinelibrary.wiley.com/doi/10.1002/sca.4950170207/abstract
The total current-voltage characteristics of the p+-n+-p-n- and n+-p- n-p- diodes under investigation show branches of negative differential resistance. Accompanied by the appearance of negative differential resistance is a filamentation of current-density and electric-field distribution. Electron beam-induced current (EBIC) measurements were used to examine the properties of filamentation from the point of view of self-organized pattern formation. Besides the detection of the spatial distribution of the electric field, EBIC measurements give information on current-density filamentation. Furthermore, the perturbation by the electron beam gives information on the dynamic behavior of the filamentary structure.
APA:
Wierschem, A., Niedernostheide, F.-J., Gorbatyuk, A., & Purwins, H.-G. (1995). Observation of current-density filamentation in multilayer structures by EBIC measurements. Scanning, 17(2), 106–116. https://dx.doi.org/10.1002/sca.4950170207
MLA:
Wierschem, Andreas, et al. "Observation of current-density filamentation in multilayer structures by EBIC measurements." Scanning 17.2 (1995): 106116.
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