Surface structure characterization by photoelectron holography

Zharnikov M, Weinelt M, Zebisch P, Steinrück HP (1996)

Publication Type: Journal article, Original article

Publication year: 1996

Journal

Thin Solid Films Elsevier

Original Authors: Zharnikov M., Weinelt M., Zebisch P., Steinrück H.-P.

Publisher: Elsevier

Book Volume: 275

Pages Range: 266-269

DOI: 10.1016/0040-6090(95)07059-1

Abstract

The applicability of photoelectron holography to determine the structure of clean and adsorbate-covered metal surfaces is investigated. The real space structure of various systems is reconstructed from photoelectron diffraction patterns at various kinetic energies using (1) the single wavenumber and (2) the multiple wavenumber reconstruction algorithm. It is demonstrated that adsorption sites can be unequivocally identified using the multiple wavenumber approach.

Authors with CRIS profile

Hans-Peter Steinrück Lehrstuhl für Physikalische Chemie II

Involved external institutions

Technische Universität München (TUM) DE Germany (DE) Freie Universität Berlin DE Germany (DE) Max-Planck-Institut für Mikrostrukturphysik (MSP) / Max Planck Institute for Microstructure Physics DE Germany (DE)

How to cite

APA:

Zharnikov, M., Weinelt, M., Zebisch, P., & Steinrück, H.-P. (1996). Surface structure characterization by photoelectron holography. Thin Solid Films, 275, 266-269. https://dx.doi.org/10.1016/0040-6090(95)07059-1

MLA:

Zharnikov, M., et al. "Surface structure characterization by photoelectron holography." Thin Solid Films 275 (1996): 266-269.

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