Simulation-based comparison of noise effects in wavelength modulation spectroscopy and direct absorption TDLAS

Lins B, Zinn P, Engelbrecht R, Schmauß B (2010)


Publication Language: English

Publication Type: Journal article

Publication year: 2010

Journal

Publisher: Springer Verlag (Germany)

Book Volume: 100

Pages Range: 367-376

DOI: 10.1007/s00340-009-3881-5

Abstract

A simulative investigation of noise effects in wavelength modulation spectroscopy (WMS) and direct absorption diode laser absorption spectroscopy is presented. Special attention is paid to the impact of quantization noise of the analog-to-digital conversion (ADC) of the photodetector signal in the two detection schemes with the goal of estimating the necessary ADC resolution for each technique. With laser relative intensity noise (RIN), photodetector shot noise and thermal amplifier noise included, the strategies used for noise reduction in direct and wavelength modulation spectroscopy are compared by simulating two respective systems. Results show that because of the combined effects of dithering by RIN and signal averaging, the resolutions required for the direct absorption setup are only slightly higher than for the WMS setup. Only for small contributions of RIN an increase in resolution will significantly improve signal quality in the direct scheme. © Springer-Verlag 2010.

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APA:

Lins, B., Zinn, P., Engelbrecht, R., & Schmauß, B. (2010). Simulation-based comparison of noise effects in wavelength modulation spectroscopy and direct absorption TDLAS. Applied Physics B-Lasers and Optics, 100, 367-376. https://dx.doi.org/10.1007/s00340-009-3881-5

MLA:

Lins, Bastian, et al. "Simulation-based comparison of noise effects in wavelength modulation spectroscopy and direct absorption TDLAS." Applied Physics B-Lasers and Optics 100 (2010): 367-376.

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