Real-time evaluation of thin film drying kinetics using an advanced, multi-probe optical setup

Journal article
(Original article)


Publication Details

Author(s): Güldal NS, Kassar T, Berlinghof M, Ameri T, Osvet A, Pacios R, Li Destri G, Unruh T, Brabec C
Journal: Journal of Materials Chemistry C
Publisher: Royal Society of Chemistry
Publication year: 2016
Volume: 4
Journal issue: 11
Pages range: 2178-2186
ISSN: 2050-7526


Abstract


Solution-processed organic photovoltaic devices are advantageous due to their low-cost large area manufacturing techniques, such as slot-die coating, gravure printing and roll-to-roll coating. The final microstructure of a polymer:fullerene bulk-heterojunction (BHJ) film is a fine interplay between solution thermodynamics (e.g. solubility, miscibility...) and kinetics (e.g. solvent evaporation, polymer ordering, phase separation...) during the drying process. In order to design better performing organic photovoltaic devices, gaining knowledge over the drying properties of polymer:fullerene thin films is essential. A novel in situ thin film drying characterization chamber, equipped with white-light reflectometry, laser light scattering and photoluminescence, is presented in combination with grazing-incidence X-ray diffraction on two different polymer:fullerene bulk heterojunctions based on poly-(3-hexylthiophene-2,5-diyl) (P3HT) and polythieno[3,2b]thiophene-diketopyrrolopyrrole-co-thiophene (DPP-TT-T) polymers. With photoluminescence applied for the first time as an in situ method for such drying studies, these single-chamber measurements track the fine interplay between thermodynamics and kinetics of thin film drying and provide invaluable information on solution behavior and microstructure formation.



FAU Authors / FAU Editors

Ameri, Tayebeh Dr.
Berlinghof, Marvin
Lehrstuhl für Werkstoffwissenschaften (Materialien der Elektronik und der Energietechnologie)
Lehrstuhl für Kristallographie und Strukturphysik
Brabec, Christoph Prof. Dr.
Lehrstuhl für Werkstoffwissenschaften (Materialien der Elektronik und der Energietechnologie)
Lehrstuhl für Werkstoffwissenschaften (Materialien der Elektronik und der Energietechnologie)
Güldal, Nusret Sena
Kassar, Thaer
Professur für Nanomaterialcharakterisierung (Streumethoden)
Osvet, Andres Dr.
Lehrstuhl für Werkstoffwissenschaften (Materialien der Elektronik und der Energietechnologie)
Unruh, Tobias Prof. Dr.
Professur für Nanomaterialcharakterisierung (Streumethoden)


Additional Organisation
Exzellenz-Cluster Engineering of Advanced Materials


How to cite

APA:
Güldal, N.S., Kassar, T., Berlinghof, M., Ameri, T., Osvet, A., Pacios, R.,... Brabec, C. (2016). Real-time evaluation of thin film drying kinetics using an advanced, multi-probe optical setup. Journal of Materials Chemistry C, 4(11), 2178-2186. https://dx.doi.org/10.1039/c5tc03448e

MLA:
Güldal, Nusret Sena, et al. "Real-time evaluation of thin film drying kinetics using an advanced, multi-probe optical setup." Journal of Materials Chemistry C 4.11 (2016): 2178-2186.

BibTeX: 

Last updated on 2018-19-04 at 03:39