High-performance direct conversion X-ray detectors based on sintered hybrid lead triiodide perovskite wafers

Journal article
(Original article)


Publication Details

Author(s): Shrestha S, Fischer R, Matt G, Feldner P, Michel T, Osvet A, Levchuk I, Merle B, Golkar S, Chen H, Tedde SF, Schmidt O, Hock R, Ruehrig M, Göken M, Heiß W, Anton G, Brabec C
Journal: Nature Photonics
Publisher: NATURE PUBLISHING GROUP
Publication year: 2017
Volume: 11
Journal issue: 7
Pages range: 436-+
ISSN: 1749-4885
Language: English


Abstract


Lead halide perovskite semiconductors are in general known to have an inherently high X-ray absorption cross-section and a significantly higher carrier mobility than any other low-temperature solution-processed semiconductor. So far, the processing of several-hundred-micrometres-thick high-quality crystalline perovskite films over a large area has been unresolved for efficient X-ray detection. In this Article, we present a mechanical sintering process to fabricate polycrystalline methyl ammonium lead triiodide perovskite (MAPbI(3)) wafers with millimetre thickness and well-defined crystallinity. Benchmarking of the MAPbI(3) wafers against state-of-the-art CdTe detectors reveals competitive conversion efficiencies of 2,527 mu C Gy(air)(-1) cm(-2) under 70 kV(p) X-ray exposure. The high ambipolar mobility-lifetime product of 2 x 10(-4) cm(2) V-1 is suggested to be responsible for this exceptionally high sensitivity. Our findings inform a new generation of highly efficient and low-cost X-ray detectors based on perovskite wafers.



FAU Authors / FAU Editors

Anton, Gisela Prof. Dr.
Lehrstuhl für Experimentalphysik (Teilchen- und Astroteilchenphysik)
Brabec, Christoph Prof. Dr.
Institute Materials for Electronics and Energy Technology (i-MEET)
Chen, Haiwei
Institute Materials for Electronics and Energy Technology (i-MEET)
Feldner, Patrick
Lehrstuhl für Werkstoffwissenschaften (Allgemeine Werkstoffeigenschaften)
Göken, Mathias Prof. Dr.
Lehrstuhl für Werkstoffwissenschaften (Allgemeine Werkstoffeigenschaften)
Golkar, Saeedeh
Lehrstuhl für Feststoff- und Grenzflächenverfahrenstechnik
Heiß, Wolfgang Prof. Dr.
Professur für Werkstoffwissenschaften (lösungsprozessierte Halbleitermaterialien)
Hock, Rainer Prof. Dr.
Professur für Kristallographie und Strukturphysik
Levchuk, Ievgen
Institute Materials for Electronics and Energy Technology (i-MEET)
Matt, Gebhard Dr.
Institute Materials for Electronics and Energy Technology (i-MEET)
Merle, Benoit PD Dr. habil.
Lehrstuhl für Werkstoffwissenschaften (Allgemeine Werkstoffeigenschaften)
Michel, Thilo PD Dr.
Lehrstuhl für Experimentalphysik (Teilchen- und Astroteilchenphysik)
Osvet, Andres Dr.
Institute Materials for Electronics and Energy Technology (i-MEET)
Shrestha, Shreetu
Institute Materials for Electronics and Energy Technology (i-MEET)


Additional Organisation
Technische Fakultät
Institute Materials for Electronics and Energy Technology (i-MEET)
Graduiertenkolleg 1896/2 In situ Mikroskopie mit Elektronen, Röntgenstrahlen und Rastersonden
Exzellenz-Cluster Engineering of Advanced Materials
Interdisziplinäres Zentrum, Center for Nanoanalysis and Electron Microscopy (CENEM)


External institutions with authors

Siemens AG, Healthcare Sector


Research Fields

B Nanoelectronic Materials
Exzellenz-Cluster Engineering of Advanced Materials
A2 Nanoanalysis and Microscopy
Exzellenz-Cluster Engineering of Advanced Materials
Neue Materialien und Prozesse
Research focus area of a faculty: Technische Fakultät


How to cite

APA:
Shrestha, S., Fischer, R., Matt, G., Feldner, P., Michel, T., Osvet, A.,... Brabec, C. (2017). High-performance direct conversion X-ray detectors based on sintered hybrid lead triiodide perovskite wafers. Nature Photonics, 11(7), 436-+. https://dx.doi.org/10.1038/NPHOTON.2017.94

MLA:
Shrestha, Shreetu, et al. "High-performance direct conversion X-ray detectors based on sintered hybrid lead triiodide perovskite wafers." Nature Photonics 11.7 (2017): 436-+.

BibTeX: 

Last updated on 2019-28-05 at 13:35