Characterization of kesterite thin films fabricated by rapid thermal processing of stacked elemental layers using spatially resolved cathodoluminescence

Journal article


Publication Details

Author(s): Künecke U, Hetzner C, Möckel S, Yoo H, Hock R, Wellmann P
Journal: Thin Solid Films
Publisher: Elsevier
Publication year: 2015
Volume: 582
Pages range: 387-391
ISSN: 0040-6090
Language: English


Abstract


We report on the microstructure analysis of kesterite (Cu2ZnSnSe4) layers from rapid thermal processing of sequential elemental layers by spatially resolved cathodoluminescence in a scanning electron microscope. Energy dispersive X-ray fluorescence, X-ray diffraction and Raman spectroscopy were carried out for the validation of the findings. Special emphasis is put on the discussion of the occurrence of the secondary phases Cu2SnSe3, Cu2Se, ZnSe and SnSe. (C) 2014 Elsevier B.V. All rights reserved.



FAU Authors / FAU Editors

Hock, Rainer Prof. Dr.
Professur für Kristallographie und Strukturphysik
Künecke, Ulrike Dr.-Ing.
Professur für Werkstoffwissenschaften (Werkstoffe der Elektrotechnik)
Möckel, Stefan
Professur für Werkstoffwissenschaften (Werkstoffe der Elektrotechnik)
Wellmann, Peter Prof. Dr.-Ing.
Professur für Werkstoffwissenschaften (Werkstoffe der Elektrotechnik)
Yoo, Hyesun
Professur für Kristallographie und Strukturphysik


How to cite

APA:
Künecke, U., Hetzner, C., Möckel, S., Yoo, H., Hock, R., & Wellmann, P. (2015). Characterization of kesterite thin films fabricated by rapid thermal processing of stacked elemental layers using spatially resolved cathodoluminescence. Thin Solid Films, 582, 387-391. https://dx.doi.org/10.1016/j.tsf.2014.10.063

MLA:
Künecke, Ulrike, et al. "Characterization of kesterite thin films fabricated by rapid thermal processing of stacked elemental layers using spatially resolved cathodoluminescence." Thin Solid Films 582 (2015): 387-391.

BibTeX: 

Last updated on 2018-17-06 at 07:23