Novel Approach Based on Continuous Trench Modelling to Predict Focused Ion Beam Prepared Freeform Surfaces

Bilbao-Guillerna A, Thiruvallur Eachambadi R, Cadot GBJ, Axinte DA, Billingham J, Stumpf F, Stumpf F, Beuer S, Rommel M (2018)

Publication Type: Journal article

Publication year: 2018

Journal

Journal of Materials Processing Technology Elsevier

DOI: 10.1016/j.jmatprotec.2017.10.024

Authors with CRIS profile

Raghavendran Thiruvallur Eachambadi Lehrstuhl für Elektronische Bauelemente Florian Stumpf Lehrstuhl für Elektronische Bauelemente

Involved external institutions

Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie (IISB) DE Germany (DE) University of Nottingham GB United Kingdom (GB)

How to cite

APA:

Bilbao-Guillerna, A., Thiruvallur Eachambadi, R., Cadot, G.B.J., Axinte, D.A., Billingham, J., Stumpf, F.,... Rommel, M. (2018). Novel Approach Based on Continuous Trench Modelling to Predict Focused Ion Beam Prepared Freeform Surfaces. Journal of Materials Processing Technology. https://doi.org/10.1016/j.jmatprotec.2017.10.024

MLA:

Bilbao-Guillerna, A., et al. "Novel Approach Based on Continuous Trench Modelling to Predict Focused Ion Beam Prepared Freeform Surfaces." Journal of Materials Processing Technology (2018).

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