Dual analyzer system for surface analysis dedicated for angle-resolved photoelectron spectroscopy at liquid surfaces and interfaces

Journal article


Publication Details

Author(s): Niedermaier I, Kolbeck C, Steinrück HP, Maier F
Journal: Review of Scientific Instruments
Publisher: American Institute of Physics (AIP)
Publication year: 2016
Volume: 87
Journal issue: 4
ISSN: 0034-6748
eISSN: 1089-7623


Abstract


The investigation of liquid surfaces and interfaces with the powerful toolbox of ultra-high vacuum (UHV)-based surface science techniques generally has to overcome the issue of liquid evaporation within the vacuum system. In the last decade, however, new classes of liquids with negligible vapor pressure at room temperature-in particular, ionic liquids (ILs)-have emerged for surface science studies. It has been demonstrated that particularly angle-resolved X-ray Photoelectron Spectroscopy (ARXPS) allows for investigating phenomena that occur at gas-liquid and liquid-solid interfaces on the molecular level. The results are not only relevant for IL systems but also for liquids in general. In all of these previous ARXPS studies, the sample holder had to be tilted in order to change the polar detection angle of emitted photoelectrons, which restricted the liquid systems to very thin viscous IL films coating a flat solid support. We now report on the concept and realization of a new and unique laboratory "Dual Analyzer System for Surface Analysis (DASSA)" which enables fast ARXPS, UV photoelectron spectroscopy, imaging XPS, and low-energy ion scattering at the horizontal surface plane of macroscopically thick non-volatile liquid samples. It comprises a UHV chamber equipped with two electron analyzers mounted for simultaneous measurements in 0 degrees and 80 degrees emission relative to the surface normal. The performance of DASSA on a first macroscopic liquid system will be demonstrated. (C) 2016 AIP Publishing LLC.



FAU Authors / FAU Editors

Kolbeck, Claudia Dr.
Lehrstuhl für Physikalische Chemie II
Maier, Florian Dr.
Lehrstuhl für Physikalische Chemie II
Niedermaier, Inga
Lehrstuhl für Physikalische Chemie II
Steinrück, Hans-Peter Prof. Dr.
Lehrstuhl für Physikalische Chemie II


Additional Organisation
Exzellenz-Cluster Engineering of Advanced Materials


Research Fields

D Catalytic Materials
Exzellenz-Cluster Engineering of Advanced Materials


How to cite

APA:
Niedermaier, I., Kolbeck, C., Steinrück, H.-P., & Maier, F. (2016). Dual analyzer system for surface analysis dedicated for angle-resolved photoelectron spectroscopy at liquid surfaces and interfaces. Review of Scientific Instruments, 87(4). https://dx.doi.org/10.1063/1.4942943

MLA:
Niedermaier, Inga, et al. "Dual analyzer system for surface analysis dedicated for angle-resolved photoelectron spectroscopy at liquid surfaces and interfaces." Review of Scientific Instruments 87.4 (2016).

BibTeX: 

Last updated on 2019-17-01 at 09:32