Be-chalcogenides: Heteroepitaxy and interface properties

Litz T, Fischer F, Lugauer HJ, Keim M, Zehnder U, Ossau W, Gerhard T, Gall R, Waag A, Landwehr G, Nagelstraßer M, Steinrück HP, Walter T, Gerthsen D (1998)


Publication Type: Journal article, Original article

Publication year: 1998

Journal

Original Authors: Litz M.Th., Fischer F., Lugauer H.-J., Keim M., Zehnder U., Ossau W., Gerhard Th., Gall R., Waag A., Landwehr G., Nagelstrasser M., Steinrück H.-P., Walter Th., Gerthsen D.

Publisher: Elsevier

Pages Range: 429-434

URI: https://www.scopus.com/record/display.uri?eid=2-s2.0-0031703255&origin=inward

Abstract

We report on the molecular beam epitaxy and the properties of Be-chalcogenides. Especially the interface between ZnSe and BeTe and BeTe/ZnSe superlattices have been studied by means of HRXRD (high resolution X-ray diffraction), HRTEM (high resolution transmission-electron-microscopy), RHEED (reflection-high-energy-electron-diffraction), photo-electron-spectroscopy (PES) and photo-luminescence (PL). A strong dependence of the structural and electronic properties of these superlattices (SL) on the interface configuration has been found. A high valence band offset of about 1 eV between BeTe and ZnSe has been determined by means of photo-luminescence and photo-electron-spectroscopy. © 1998 Elsevier Science B.V.

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APA:

Litz, T., Fischer, F., Lugauer, H.-J., Keim, M., Zehnder, U., Ossau, W.,... Gerthsen, D. (1998). Be-chalcogenides: Heteroepitaxy and interface properties. Applied Surface Science, 429-434.

MLA:

Litz, T., et al. "Be-chalcogenides: Heteroepitaxy and interface properties." Applied Surface Science (1998): 429-434.

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