Höfert O, Gleichweit C, Steinrück HP, Papp C (2013)
Publication Type: Journal article
Publication year: 2013
Original Authors: Höfert O., Gleichweit C., Steinrück H.-P., Papp C.
Publisher: American Institute of Physics (AIP)
Book Volume: 84
Article Number: 093103
Journal Issue: 9
DOI: 10.1063/1.4821496
We introduce a new approach for ultrafast in situ high-resolution X-ray photoelectron spectroscopy (XPS) to study surface processes and reaction kinetics on the microsecond timescale. The main idea is to follow the intensity at a fixed binding energy using a commercial 7 channeltron electron analyzer with a modified signal processing setup. This concept allows for flexible switching between measuring conventional XP spectra and ultrafast XPS. The experimental modifications are described in detail. As an example, we present measurements for the adsorption and desorption of CO on Pt(111), performed at the synchrotron radiation facility BESSY II, with a time resolution of 500 μs. Due to the ultrafast measurements, we are able to follow adsorption and desorption in situ at pressures of 2 × 10 mbar and temperatures up to 500 K. The data are consistently analyzed using a simple model in line with data obtained with conventional fast XPS at temperatures below 460 K. Technically, our new approach allows measurement on even shorter timescales, down to 20 μs. © 2013 AIP Publishing LLC.
APA:
Höfert, O., Gleichweit, C., Steinrück, H.-P., & Papp, C. (2013). Ultrafast x-ray photoelectron spectroscopy in the microsecond time domain. Review of Scientific Instruments, 84(9). https://doi.org/10.1063/1.4821496
MLA:
Höfert, Oliver, et al. "Ultrafast x-ray photoelectron spectroscopy in the microsecond time domain." Review of Scientific Instruments 84.9 (2013).
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