In-operando studies of Ag-TCNQ nanocrystals using Raman and soft x-ray microspectroscopy

Journal article


Publication Details

Author(s): Rösner B, Schmidt U, Fink R
Journal: Journal of Physics: Conference Series
Publication year: 2017
Volume: 849
Pages range: 1-4
ISSN: 1742-6588


Abstract


We characterize individual Ag-TCNQ nanocrystals during switching their resistivity state in operando. Raman and soft X-ray absorption microspectroscopy are employed to disclose the electronic state of the organic component in dependency of applied voltage. Whereas Raman microspectroscopy offers qualitative insight into the conversion of negatively charged TCNQ molecules to their neutral counterpart, quantification of the neutral fraction can be achieved using X-ray absorption spectroscopy. These results allow a detailed investigation of resistivity switching in electrically bistable Ag-TCNQ nanocrystals.



FAU Authors / FAU Editors

Fink, Rainer Prof. Dr.
Professur für Physikalische Chemie
Rösner, Benedikt
Lehrstuhl für Physikalische Chemie II


Additional Organisation
Graduiertenkolleg 1896/2 In situ Mikroskopie mit Elektronen, Röntgenstrahlen und Rastersonden
Interdisziplinäres Zentrum, Center for Nanoanalysis and Electron Microscopy (CENEM)


External institutions with authors

WITec Wissenschaftliche Instrumente und Technologie GmbH


How to cite

APA:
Rösner, B., Schmidt, U., & Fink, R. (2017). In-operando studies of Ag-TCNQ nanocrystals using Raman and soft x-ray microspectroscopy. Journal of Physics: Conference Series, 849, 1-4. https://dx.doi.org/10.1088/1742-6596/849/1/012016

MLA:
Rösner, Benedikt, Ute Schmidt, and Rainer Fink. "In-operando studies of Ag-TCNQ nanocrystals using Raman and soft x-ray microspectroscopy." Journal of Physics: Conference Series 849 (2017): 1-4.

BibTeX: 

Last updated on 2019-03-06 at 16:07