A Coplanar Waveguide Resonator Based In-Line Material Characterization Sensor for Bulk and Metallized Dielectrics

Beitrag in einer Fachzeitschrift


Details zur Publikation

Autor(en): Talai A, Gold G, Frank M, Mann S, Weigel R, Kölpin A
Zeitschrift: Frequenz
Verlag: Walter de Gruyter GmbH
Jahr der Veröffentlichung: 2016
Band: 0
Heftnummer: 0
ISSN: 0016-1136
Sprache: Englisch


Abstract


Microwave Materials such as Rogers RO3003 are subject to process-related fluctuations in terms of the relative permittivity and dielectric loss. The behavior of high frequency circuits like patch-antenna arrays and their distribution networks is dependent on the effective wavelength. Therefore, fluctuations of the complex permittivity will influence the resonance frequency and beam direction of the antennas. This paper presents a grounded coplanar waveguide based sensor, which can measure the complex permittivity at 77 GHz, as well as at other resonance frequencies, by applying it on top of the manufactured depaneling. The relative permittivity of the material under test (MUT) is a function of the resonance frequency shift and the dielectric loss of the MUT can be determined by transmission amplitude variations at the resonances. In addition, the sensor is robust against floating ground metallizations on inner printed circuit board layers, which are typically distributed over the entire surface below antennas. Furthermore, the impact from conductor surface roughness on the measured permittivity values is determined using the Gradient Model.



FAU-Autoren / FAU-Herausgeber

Frank, Martin
Lehrstuhl für Technische Elektronik
Gold, Gerald Dr.-Ing.
Professur für Rechnergestützten Schaltungsentwurf
Kölpin, Alexander PD Dr.
Lehrstuhl für Technische Elektronik
Mann, Sebastian
Lehrstuhl für Technische Elektronik
Talai, Armin
Lehrstuhl für Technische Elektronik
Weigel, Robert Prof. Dr.-Ing.
Lehrstuhl für Technische Elektronik


Zitierweisen

APA:
Talai, A., Gold, G., Frank, M., Mann, S., Weigel, R., & Kölpin, A. (2016). A Coplanar Waveguide Resonator Based In-Line Material Characterization Sensor for Bulk and Metallized Dielectrics. Frequenz, 0(0). https://dx.doi.org/10.1515/freq-2016-0201

MLA:
Talai, Armin, et al. "A Coplanar Waveguide Resonator Based In-Line Material Characterization Sensor for Bulk and Metallized Dielectrics." Frequenz 0.0 (2016).

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Zuletzt aktualisiert 2018-10-08 um 11:09