Normalizing a relativistic model of X-ray reflection. Definition of the reflection fraction and its implementation in relxill
Dauser T, Garcia J, Walton DJ, Eikmann W, Kallman T, Mcclintock J, Wilms J (2016)
Publication Type: Journal article, Original article
Publication year: 2016
Journal
Book Volume: 590
Article Number: A76
DOI: 10.1051/0004-6361/201628135
Abstract
The only relativistic reflection model that implements a parameter relating the intensity incident on an accretion disk to the observed intensity is relxill. The parameter used in earlier versions of this model, referred to as the reflection strength, is unsatisfactory; it has been superseded by a parameter that provides insight into the accretion geometry, namely the reflection fraction. The reflection fraction is defined as the ratio of the coronal intensity illuminating the disk to the coronal intensity that reaches the observer. Methods. The relxill model combines a general relativistic ray-tracing code and a photoionization code to compute the component of radiation reflected from an accretion that is illuminated by an external source. The reflection fraction is a particularly important parameter for relativistic models with well-defined geometry, such as the lamp post model, which is a focus of this paper. Results. Relativistic spectra are compared for three inclinations and for four values of the key parameter of the lamp post model, namely the height above the black hole of the illuminating, on-axis point source. In all cases, the strongest reflection is produced for low source heights and high spin. A low-spin black hole is shown to be incapable of producing enhanced relativistic reflection. Results for the relxill model are compared to those obtained with other models and a Monte Carlo simulation. Conclusions. Fitting data by using the relxill model and the recently implemented reflection fraction, the geometry of a system can be constrained. The reflection fraction is independent of system parameters such as inclination and black hole spin. The reflection-fraction parameter was implemented with the name refl-frac in all flavours of the relxill model, and the non-relativistic reflection model xillver, in v0.4a (18 January 2016).
Authors with CRIS profile
Thomas Dauser
Dr.Karl-Remeis-Sternwarte Bamberg, Astronomisches Institut
Wiebke Eikmann
Dr.Karl-Remeis-Sternwarte Bamberg, Astronomisches Institut
Jörn Wilms
Professur für Astronomie und Astrophysik
Involved external institutions
National Aeronautics and Space Administration (NASA)
United States (USA) (US)
Harvard University
United States (USA) (US)
California Institute of Technology (Caltech)
United States (USA) (US)
United States (USA) (US)
Harvard University
United States (USA) (US)
California Institute of Technology (Caltech)
United States (USA) (US)
How to cite
APA:
Dauser, T., Garcia, J., Walton, D.J., Eikmann, W., Kallman, T., Mcclintock, J., & Wilms, J. (2016). Normalizing a relativistic model of X-ray reflection. Definition of the reflection fraction and its implementation in relxill. Astronomy & Astrophysics, 590. https://doi.org/10.1051/0004-6361/201628135
MLA:
Dauser, Thomas, et al. "Normalizing a relativistic model of X-ray reflection. Definition of the reflection fraction and its implementation in relxill." Astronomy & Astrophysics 590 (2016).
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