A model-based synthetic aperture focusing technique for acoustic microscopy

Wüst M, Nierla M, Rupitsch S (2016)

Publication Language: English

Publication Type: Conference contribution, Conference Contribution

Publication year: 2016

Conference Proceedings Title: Ultrasonics Symposium (IUS), 2016 IEEE International

Event location: Tours FR

ISBN: 978-1-4673-9897-8

DOI: 10.1109/ULTSYM.2016.7728458

Abstract

This contribution is concerned with a technique to precisely measure the physical dimensions of flaws in solid specimen by pulse-echo mode acoustic microscopy. We have implemented a synthetic aperture focusing technique (SAFT), which is based on a semi-numerical simulation approach (SIRFEM). In acoustic microscopy, one normally applies single-element transducers with center frequencies above 10MHz. Due to the very short wavelengths, numerical simulations demand a very fine discretized measurement setup. This would lead to extensive calculation costs. Therefore, we model the sound propagation in the fluid coupling medium between transducer surface and specimen analytically by the spatial impulse response (SIR) method. Only the mechanical wave propagation in the solid specimen is then simulated by a higher-order finite element method (FEM). This coupled SIRFEM method can be used to calculate the RF signal output (i.e., echo data) of ultrasonic transducers. The presented model-based SAFT algorithm is based on an optimized filter-kernel, which is generated by an adapted SIRFEM simulation.

Authors with CRIS profile

Michael Wüst Lehrstuhl für Autonome Systeme und Mechatronik Michael Nierla Lehrstuhl für Autonome Systeme und Mechatronik Stefan Rupitsch Lehrstuhl für Autonome Systeme und Mechatronik

How to cite

APA:

Wüst, M., Nierla, M., & Rupitsch, S. (2016). A model-based synthetic aperture focusing technique for acoustic microscopy. In IEEE (Eds.), Ultrasonics Symposium (IUS), 2016 IEEE International. Tours, FR.

MLA:

Wüst, Michael, Michael Nierla, and Stefan Rupitsch. "A model-based synthetic aperture focusing technique for acoustic microscopy." Proceedings of the IEEE Ultrasonics Symposium (IUS) 2016, Tours Ed. IEEE, 2016.

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