In-situ X-ray diffraction analysis of the recrystallization process in Cu2ZnSnS4nanoparticles synthesised by hot-injection

Journal article
(Original article)


Publication Details

Author(s): Brandl M, Ahmad R, Distaso M, Azimi SH, Hou Y, Peukert W, Brabec C, Hock R
Journal: Thin Solid Films
Publisher: Elsevier
Publication year: 2015
Volume: 582
Pages range: 269-271
ISSN: 0040-6090
Language: English


Abstract


Kesterite CuZnSnS(CZTS) is a promising material for thin film solar cell applications. The biggest advantages of this compound lie in the abundance and non-toxicity of the contained elements. Low temperature hot injection synthesis can provide an economic way to produce CZTS nanoparticles for application in solution processed solar cells. Powder X-ray diffraction (PXRD) measurements on the as-synthesised particles suggest that the crystal structure is cubic and can be best described as sphalerite-like. This means that the cations in the CZTS are statistically distributed on the cation sites of the crystal lattice rather than well-ordered like in the tetragonal kesterite structure. An in-situ PXRD measurement while annealing the particles up to 550 °C revealed a recrystallization process that transforms the structure from cubic to tetragonal meaning an ordering of the cations.



FAU Authors / FAU Editors

Ahmad, Rameez
Lehrstuhl für Feststoff- und Grenzflächenverfahrenstechnik
Lehrstuhl für Feststoff- und Grenzflächenverfahrenstechnik
Azimi, Seyed Hamed Dr.
Lehrstuhl für Werkstoffwissenschaften (Materialien der Elektronik und der Energietechnologie)
Brabec, Christoph Prof. Dr.
Lehrstuhl für Werkstoffwissenschaften (Materialien der Elektronik und der Energietechnologie)
Brandl, Marco
Lehrstuhl für Kristallographie und Strukturphysik
Distaso, Monica Dr.
Lehrstuhl für Feststoff- und Grenzflächenverfahrenstechnik
Hock, Rainer Prof. Dr.
Professur für Kristallographie und Strukturphysik
Hou, Yi Dr.-Ing.
Lehrstuhl für Werkstoffwissenschaften (Materialien der Elektronik und der Energietechnologie)
Peukert, Wolfgang Prof. Dr.-Ing.


How to cite

APA:
Brandl, M., Ahmad, R., Distaso, M., Azimi, S.H., Hou, Y., Peukert, W.,... Hock, R. (2015). In-situ X-ray diffraction analysis of the recrystallization process in Cu2ZnSnS4nanoparticles synthesised by hot-injection. Thin Solid Films, 582, 269-271. https://dx.doi.org/10.1016/j.tsf.2014.10.077

MLA:
Brandl, Marco, et al. "In-situ X-ray diffraction analysis of the recrystallization process in Cu2ZnSnS4nanoparticles synthesised by hot-injection." Thin Solid Films 582 (2015): 269-271.

BibTeX: 

Last updated on 2018-19-04 at 03:39