In-Line Material Characterization Sensors Operating at 10 GHz and 77 GHz

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Details zur Publikation

Autorinnen und Autoren: Frank M, Talai A, Weigel R, Kölpin A
Jahr der Veröffentlichung: 2017
Seitenbereich: 1306-1309
Sprache: Englisch


Abstract


This paper describes the design of two sensors for the in-line material characterization of bulk and metallized dielectrics around 10,GHz and 77,GHz in order to determine the relative permittivity of RF substrates. The sensors are based on a resonant grounded coplanar waveguide structure and can be applied on top of a material under test. The shift in the resonance frequency between loaded and unloaded resonator is evaluated by 3D full wave simulations in order to determine the relative permittivity. The basic sensor structure is improved for the in-line characterization of printed circuit boards by a clearance of the resonator area and the filling of the air gaps. Measurements with different MUTs were performed with both sensors followed by the evaluation of the relative permittivity. The results are in good agreement with the expected permittivity values and show high reproducibility.


FAU-Autorinnen und Autoren / FAU-Herausgeberinnen und Herausgeber

Frank, Martin
Lehrstuhl für Technische Elektronik
Kölpin, Alexander PD Dr.
Lehrstuhl für Technische Elektronik
Talai, Armin
Lehrstuhl für Technische Elektronik
Weigel, Robert Prof. Dr.-Ing.
Lehrstuhl für Technische Elektronik


Zitierweisen

APA:
Frank, M., Talai, A., Weigel, R., & Kölpin, A. (2017). In-Line Material Characterization Sensors Operating at 10 GHz and 77 GHz. In Proceedings of the Asia Pacific Microwave Conference (APMC) 2017 (pp. 1306-1309). Kuala Lumpur, MY.

MLA:
Frank, Martin, et al. "In-Line Material Characterization Sensors Operating at 10 GHz and 77 GHz." Proceedings of the Asia Pacific Microwave Conference (APMC) 2017, Kuala Lumpur 2017. 1306-1309.

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Zuletzt aktualisiert 2019-23-07 um 07:43

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