Advanced In-Situ Instrumentation of RF Circuits for Mixed-Field Irradiation Testing Purpose

Müller S, Danzeca S, Garcia Alía R, Brugger M, Weigel R, Kölpin A (2017)

Publication Language: English

Publication Status: Accepted

Publication Type: Conference contribution, Conference Contribution

Future Publication Type: Conference contribution

Publication year: 2017

Event location: Geneva

Open Access Link: http://inspirehep.net/record/1729616

Authors with CRIS profile

Steffen Müller Lehrstuhl für Technische Elektronik Robert Weigel Lehrstuhl für Technische Elektronik Alexander Kölpin Lehrstuhl für Technische Elektronik

Involved external institutions

Europäische Organisation für Kernforschung (CERN) CH Switzerland (CH)

How to cite

APA:

Müller, S., Danzeca, S., Garcia Alía, R., Brugger, M., Weigel, R., & Kölpin, A. (2017). Advanced In-Situ Instrumentation of RF Circuits for Mixed-Field Irradiation Testing Purpose. In Proceedings of the European Conference on Radiation and its Effects on Components and Systems (RADECS). Geneva.

MLA:

Müller, Steffen, et al. "Advanced In-Situ Instrumentation of RF Circuits for Mixed-Field Irradiation Testing Purpose." Proceedings of the European Conference on Radiation and its Effects on Components and Systems (RADECS), Geneva 2017.

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