Hans-Georg Steinrück


Lehrstuhl für Kristallographie und Strukturphysik

Publikationen (Download BibTeX)

Schmaltz, T., Gothe, B., Krause, A., Leitherer, S., Steinrück, H.-G., Thoss, M.,... Halik, M. (2017). Effect of Structure and Disorder on the Charge Transport in Defined Self-Assembled Monolayers of Organic Semiconductors. Acs Nano. https://dx.doi.org/10.1021/acsnano.7b02394
Kirschner, J., Will, J., Rejek, T., Portilla Berlanga, L., Berlinghof, M., Schweizer, P.,... Halik, M. (2017). Memory Effect of Self-Assembled PS-b-PEO Block Copolymer Films with Selectively Embedded Functionalized TiO2 Nanoparticles. Advanced Materials Interfaces. https://dx.doi.org/10.1002/admi.201700230
Schiener, A., Magerl, A., Krach, A., Seifert, S., Steinrück, H.-G., Zagorac, J.,... Weihrich, R. (2015). In situ investigation of two-step nucleation and growth of CdS nanoparticles from solution. Nanoscale, 7(26), 11328-11333. https://dx.doi.org/10.1039/c5nr01602a
Khassanov, A., Steinrück, H.-G., Schmaltz, T., Magerl, A., & Halik, M. (2015). Structural Investigations of Self-Assembled Monolayers for Organic Electronics: Results from X-ray Reflectivity. Accounts of Chemical Research, 48(7), 1901–1908. https://dx.doi.org/10.1021/acs.accounts.5b00022
Steinrück, H.-G., Will, J., Magerl, A., & Ocko, B. (2015). Structure of n-Alkyltrichlorosilane Mono layers on Si(100)/SiO2. Langmuir, 31(43), 11774-11780. https://dx.doi.org/10.1021/acs.langmuir.5b03091
Steinrück, H.-G., Schiener, A., Schindler, T., Will, J., Magerl, A., Konovalov, O.,... Ocko, B. (2014). Nanoscale structure of Si/SiO2/organics interfaces. ACS nano, 8(12), 12676-12681. https://dx.doi.org/10.1021/nn5056223
Schmaltz, T., Amin, A.Y., Khassanov, A., Meyer-Friedrichsen, T., Steinrück, H.-G., Magerl, A.,... Halik, M. (2013). Low-Voltage Self-Assembled Monolayer Field-Effect Transistors on Flexible Substrates. Advanced Materials, 25(32), 4511-4514. https://dx.doi.org/10.1002/adma.201301176
Will, J., Gröschel, A., Kot, D., Bergmann, C., Steinrück, H.-G., Schubert, M.A.,... Magerl, A. (2013). Oxygen diffusivity in silicon derived from dynamical X-ray diffraction. Journal of Applied Physics, 113(7). https://dx.doi.org/10.1063/1.4792747

Zuletzt aktualisiert 2016-05-05 um 05:32