Hans-Georg Steinrück



Organisation


Lehrstuhl für Kristallographie und Strukturphysik


Publications (Download BibTeX)


Kirschner, J., Will, J., Rejek, T., Portilla Berlanga, L., Berlinghof, M., Schweizer, P.,... Halik, M. (2017). Memory Effect of Self-Assembled PS-b-PEO Block Copolymer Films with Selectively Embedded Functionalized TiO2 Nanoparticles. Advanced Materials Interfaces. https://dx.doi.org/10.1002/admi.201700230
Schmaltz, T., Gothe, B., Krause, A., Leitherer, S., Steinrück, H.-G., Thoss, M.,... Halik, M. (2017). Effect of Structure and Disorder on the Charge Transport in Defined Self-Assembled Monolayers of Organic Semiconductors. Acs Nano. https://dx.doi.org/10.1021/acsnano.7b02394
Khassanov, A., Steinrück, H.-G., Schmaltz, T., Magerl, A., & Halik, M. (2015). Structural Investigations of Self-Assembled Monolayers for Organic Electronics: Results from X-ray Reflectivity. Accounts of Chemical Research, 48(7), 1901–1908. https://dx.doi.org/10.1021/acs.accounts.5b00022
Schiener, A., Magerl, A., Krach, A., Seifert, S., Steinrück, H.-G., Zagorac, J.,... Weihrich, R. (2015). In situ investigation of two-step nucleation and growth of CdS nanoparticles from solution. Nanoscale, 7(26), 11328-11333. https://dx.doi.org/10.1039/c5nr01602a
Steinrück, H.-G., Will, J., Magerl, A., & Ocko, B. (2015). Structure of n-Alkyltrichlorosilane Mono layers on Si(100)/SiO2. Langmuir, 31(43), 11774-11780. https://dx.doi.org/10.1021/acs.langmuir.5b03091
Steinrück, H.-G., Schiener, A., Schindler, T., Will, J., Magerl, A., Konovalov, O.,... Ocko, B. (2014). Nanoscale structure of Si/SiO2/organics interfaces. ACS nano, 8(12), 12676-12681. https://dx.doi.org/10.1021/nn5056223
Schmaltz, T., Amin, A.Y., Khassanov, A., Meyer-Friedrichsen, T., Steinrück, H.-G., Magerl, A.,... Halik, M. (2013). Low-Voltage Self-Assembled Monolayer Field-Effect Transistors on Flexible Substrates. Advanced Materials, 25(32), 4511-4514. https://dx.doi.org/10.1002/adma.201301176
Will, J., Gröschel, A., Kot, D., Bergmann, C., Steinrück, H.-G., Schubert, M.A.,... Magerl, A. (2013). Oxygen diffusivity in silicon derived from dynamical X-ray diffraction. Journal of Applied Physics, 113(7). https://dx.doi.org/10.1063/1.4792747

Last updated on 2016-05-05 at 05:32