Prof. Dr. Andreas Magerl


Lehrstuhl für Kristallographie und Strukturphysik
Lehrstuhl für Biophysik
Naturwissenschaftliche Fakultät

Publications (Download BibTeX)

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Schiener, A., Schmidt, E., Bergmann, C., Seifert, S., Zahn, D., Krach, A.,... Magerl, A. (2017). The formation of CdS quantum dots and Au nanoparticles. Zeitschrift fur Kristallographie - Crystalline Materials, 232, 39-46.
Magerl, A., Schiener, A., & Seifert, S. (2016). The stopped-drop method: A novel setup for containment-free and time-resolved measurements. Journal of Synchrotron Radiation, 23(2), 545-550.
Bergmann, C., Gröschel, A., Will, J., & Magerl, A. (2015). Strain relief via silicon self-interstitial emission in highly boron-doped silicon: A diffuse X-ray scattering study of oxygen precipitation. Journal of Applied Physics, 118(1).
Brkljaca, Z., Klimczak, M., Milicevic, Z., Weißer, M., Taccardi, N., Wasserscheid, P.,... Smith, A.-S. (2015). Complementary Molecular Dynamics and X-ray Reflectivity Study of an Imidazolium-Based Ionic Liquid at a Neutral Sapphire Interface. Journal of Physical Chemistry Letters, 6(3), 549--555.
Khassanov, A., Steinrück, H.-G., Schmaltz, T., Magerl, A., & Halik, M. (2015). Structural Investigations of Self-Assembled Monolayers for Organic Electronics: Results from X-ray Reflectivity. Accounts of Chemical Research, 48(7), 1901–1908.
Schiener, A., Magerl, A., Krach, A., Seifert, S., Steinrück, H.-G., Zagorac, J.,... Weihrich, R. (2015). In situ investigation of two-step nucleation and growth of CdS nanoparticles from solution. Nanoscale, 7(26), 11328-11333.
Steinrück, H.-G., Will, J., Magerl, A., & Ocko, B. (2015). Structure of n-Alkyltrichlorosilane Mono layers on Si(100)/SiO2. Langmuir, 31(43), 11774-11780.
Bergmann, C., Will, J., Gröschel, A., Weißer, M., & Magerl, A. (2014). Radial oxygen precipitation of a 12 '' CZ silicon crystal studied in-situ with high energy X-ray diffraction. Physica Status Solidi A-Applications and Materials Science, 211(11), 2450-2454.
Gröschel, A., Will, J., Bergmann, C., & Magerl, A. (2014). Misfit strain of oxygen precipitates in Czochralski silicon studied with energy-dispersive X-ray diffraction. Journal of Applied Physics, 115(23).
Khassanov, A., Schmaltz, T., Steinrück, H.-P., Magerl, A., Hirsch, A., & Halik, M. (2014). Interface Engineering of Molecular Charge Storage Dielectric Layers for Organic Thin-Film Memory Transistors. Advanced Materials Interfaces, 1(9), n/a.

Last updated on 2016-05-05 at 05:28