Andreas Hutzler

Thomson Researcher ID: V-9443-2018
Scopus Author ID: 56814859600


Lehrstuhl für Elektronische Bauelemente

Project member

(In situ Microscopy with Electrons, X-rays and Scanning Probes):
GRK 1896 A2: Growth and stability of anisotropic nanoparticles in liquids
Prof. Dr. Lothar Frey; Dr. Michael Jank; Prof. Dr. Erdmann Spiecker
(01/10/2013 - 30/09/2022)

Publications (Download BibTeX)

Hutzler, A. (2018). Development of advanced liquid cell architectures for high performance in situ transmission electron microscopy in materials sciences (Dissertation).
Hutzler, A., Matthus, C., Rommel, M., Jank, M., & Frey, L. (2018). Large-Area Layer Counting of 2D Materials via Visible Reflection Spectroscopy. Sydney, AU.
Hutzler, A., Schmutzler, T., Jank, M.P.M., Branscheid, R., Unruh, T., Spiecker, E., & Frey, L. (2018). Unravelling the Mechanisms of Gold−Silver Core−Shell Nanostructure Formation by in Situ TEM Using an Advanced Liquid Cell Design. Nano Letters, 18(11), 7222 - 7229.
Hutzler, A., Branscheid, R., Schmutzler, T., Jank, M., Frey, L., & Spiecker, E. (2017). Controlled silver-shell growth on gold nanorods studied by in situ liquid cell TEM techniques. In Microscopy Conference 2017 (MC 2017) - Proceedings (pp. 600 - 601). Lausanne, CH.
Hutzler, A., Matthus, C., Rommel, M., & Frey, L. (2017). Generalized approach to design multi-layer stacks for enhanced optical detectability of ultrathin layers. Applied Physics Letters, 110(2), 021909-1 - 021909-4.
Hutzler, A., Branscheid, R., Jank, M., Frey, L., & Spiecker, E. (2016). Graphene-Supported Microwell Liquid Cell for In Situ Electron Microscopy in Materials Science. Microscopy and Microanalysis, 22(S5 (Conference on In Situ and Correlative Electron Microscopy (CISCEM 2016))), 78 - 79.
Hutzler, A., Branscheid, R., Jank, M., Frey, L., & Spiecker, E. (2016). Graphene‐supported microwell liquid cell for in situ studies in TEM and SEM. In European Microscopy Congress 2016 Volume 1: Instrumentation and Methods (pp. 209 - 210). Lyon, FR: Wiley Online Libary.
Paskaleva, A., Rommel, M., Hutzler, A., Spassov, D., & Bauer, A. (2015). Tailoring the Electrical Properties of HfO2 MOS-Devices by Aluminum Doping. ACS Applied Materials and Interfaces, 7(31), 17032 - 17043.

Last updated on 2019-22-01 at 17:51