Florian Oesterle



Organisationseinheit


Lehrstuhl für Technische Elektronik


Erfindung/en


Paralleltest und Auswertung mittels Matrix-Rekonstruktion


Publikationen (Download BibTeX)


Linz, S., Oesterle, F., Lindner, S., Mann, S., Weigel, R., & Kölpin, A. (2016). Test Method for Contactless On-wafer MEMS Characterization and Production Monitoring. IEEE Transactions on Microwave Theory and Techniques, 64(11), 3918-3926. https://dx.doi.org/10.1109/TMTT.2016.2612664
Linz, S., Oesterle, F., Talai, A., Lindner, S., Mann, S., Barbon, F.,... Kölpin, A. (2015). 100 GHz Reflectometer for Sensitivity Analysis of MEMS Sensors Comprising an Intermediate Frequency Six-port Receiver. In Proceedings of the IEEE Topical Conference on Wireless Sensors and Sensor Networks (pp. 20-22). San Diego, US: IEEE.
Oesterle, F. (2015). Effizienzsteigernde Verfahren für den produktionsbegleitenden Test von MEMS-Mikrofonen (Dissertation).
Oesterle, F., Weigel, R., & Kölpin, A. (2014). Ein paralleles Verfahren zum Volumentest von kapazitiven MEMS Sensoren. In Proceedings of the 26. ITG/GI/GMM-Workshop: Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ). Banz, DE.
Oesterle, F., Fink, F., Dehe, A., Kuhn, H., Weigel, R., & Kölpin, A. (2013). A Large Deflection Model of Silicon Membranes for Testing Intrinsic Stress of MEMS Microphones by Measuring Pull-In Voltage. In Proceedings of the SPIE Microtechnologies, Smart Sensors, Actuators, and MEMS VI, Conference 8763. Grenoble, FR: SPIE.
Oesterle, F., Weigel, R., & Kölpin, A. (2013). A New Approach on MEMS Sensor Batch Testing Using an Analogue Parallel Test Methodology for Massive Reduction of Test Time. In IEEE Sensors (pp. 1-4). Baltimore, US.
Oesterle, F., Vinci, G., Weigel, R., & Kölpin, A. (2013). A Novel, W-Band Microwave Based Contactless Test Method for Mechanical Sensitivity Analysis of MEMS. In Proceedings of the IEEE International Microwave Symposium. Seattle, WA, US: IEEE.
Oesterle, F., Gardill, M., Weigel, R., & Kölpin, A. (2013). Evaluation of a Microwave Based Contact-Free Testing Method for Mechanical Sensitivity Analysis of MEMS for Inline Integration of On-Wafer Measurements. In Proceedings of the Microwave Conference (EuMC), 2013 European. Nuremberg, DE.
Kölpin, A., Vinci, G., Lindner, S., Mann, S., Barbon, F., Linz, S.,... Weigel, R. (2013). Six-Port Technology for Precise Geometrical Measurement Applications - an Overview. In Proceedings of the European Microwave Conference (EuMC) (pp. 1587-1590). Nürnberg: IEEE.
Gardill, M., Schneider, J., Oesterle, F., Fischer, G., Weigel, R., & Kölpin, A. (2013). Ultra-Wideband Small Antenna Subarray Module with Narrow Elevation Pattern. In Proceedings of the {IEEE-APS} Topical Conference on Antennas and Propagation in Wireless Communications. Torino, IT.

Zuletzt aktualisiert 2017-12-03 um 01:00