Professur für Werkstoffwissenschaften (Werkstoffe der Elektrotechnik)

Adresse:
Martensstraße 5/7
91058 Erlangen


Publikationen (Download BibTeX)


Künecke, U., Hetzner, C., Möckel, S., Yoo, H.S., Hock, R., & Wellmann, P. (2015). Characterization of kesterite thin films fabricated by rapid thermal processing of stacked elemental layers using spatially resolved cathodoluminescence. Thin Solid Films, 582, 387-391. https://dx.doi.org/10.1016/j.tsf.2014.10.063
Möckel, S., Wernicke, T., Arzig, M., Köder, P., Brandl, M., Ahmad, R.,... Wellmann, P. (2015). Low temperature formation of CuIn1 - xGaxSe2solar cell absorbers by all printed multiple species nanoparticulate Se + Cu-In + Cu-Ga precursors. Thin Solid Films, 582, 60-68. https://dx.doi.org/10.1016/j.tsf.2014.11.060
Wibowo, R.A., Möckel, S., Yoo, H.S., Hetzner, C., Hölzing, A., Wellmann, P., & Hock, R. (2013). Intermetallic compounds dynamic formation during annealing of stacked elemental layers and its influences on the crystallization of Cu2ZnSnSe4 films. Materials Chemistry and Physics, 142(1), 311-317. https://dx.doi.org/10.1016/j.matchemphys.2013.07.021
Straubinger, T., Bickermann, M., Grau, M., Hofmann, H.-D., Kadinski, L., Müller, G.,... Winnacker, A. (2000). Growth rate control in SiC-physical vapor transport method through heat transfer modeling and non-stationary process conditions. Materials Science Forum, 338-342, 39-42. https://dx.doi.org/10.4028/www.scientific.net/MSF.338-342.39
Wellmann, P., Bickermann, M., Grau, M., Hofmann, H.-D., Straubinger, T., & Winnacker, A. (1999). Online monitoring of PVT SiC bulk crystal growth using digital x-ray imaging. Materials Research Society Symposium - Proceedings, 572, 259-264. https://dx.doi.org/10.1557/PROC-572-259

Zuletzt aktualisiert 2019-24-04 um 10:25