IEEE Design and Test of Computers

Journal Abbreviation: IEEE DES TEST COMPUT
ISSN: 0740-7475
Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publications (4)

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Unpublished / Preprint

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Abstract

Guest Editors’ Introduction: Special Issue on Time-Critical Systems Design Part II (2018) Mitra T, Teich J, Thiele L Journal article, Editorial Time-Critical Systems Design: A Survey (2018) Mitra T, Teich J, Thiele L Journal article Guest Editors’ Introduction: Special Issue on Time-Critical Systems Design (2018) Mitra T, Teich J, Thiele L Journal article Recap of the 2016 DATE Conference & Exhibition (2016) Fanucci L, Teich J Journal article