IEEE Design and Test of Computers

Journal Abbreviation: IEEE DES TEST COMPUT
ISSN: 0740-7475
Publisher: Institute of Electrical and Electronics Engineers (IEEE)



Publications


Journal issue: 2, Volume: 35, Pages range: 5-7
Guest Editors’ Introduction: Special Issue on Time-Critical Systems Design (2018)
Mitra T, Teich J, Thiele L

Journal issue: 4, Volume: 35, Pages range: 5 - 6
Guest Editors’ Introduction: Special Issue on Time-Critical Systems Design Part II (2018)
Mitra T, Teich J, Thiele L

Journal issue: 2, Volume: 35, Pages range: 8-26
Time-Critical Systems Design: A Survey (2018)
Mitra T, Teich J, Thiele L

Journal issue: 4, Volume: 33, Pages range: 114-117
Recap of the 2016 DATE Conference & Exhibition (2016)
Fanucci L, Teich J


Last updated on 2018-27-09 at 14:39