Electronic Journal of Statistics

Journal Abbreviation: ELECTRON J STAT
ISSN: 1935-7524
Publisher: Institute of Mathematical Statistics (IMS): OAJ / Institute of Mathematical Statistics



Publications


Journal issue: 2, Volume: 12, Pages range: 2873-2904
Goodness-of-fit tests for complete spatial randomness based on Minkowski functionals of binary images (2018)
Ebner B, Henze N, Klatt MA, et al.


Last updated on 2014-11-12 at 07:04