European Physical Journal-Applied Physics

Journal Abbreviation: EUR PHYS J-APPL PHYS
ISSN: 1286-0042
Publisher: EDP Sciences

Publications (2)

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Abstract

Influence of dislocation content on the quantitative determination of the doping level distribution in n-GaAs using absorption mapping (2006) Künecke U, Wellmann P Journal article Quantitative determination of the doping level distribution in n-type GaAs using absorption mapping (2004) Wellmann P, Albrecht A, Künecke U, Birkmann B, Müller G, Jurisch M Journal article