European Physical Journal B
Journal Abbreviation:  EUR PHYS J B  
ISSN: 1434-6028
Publisher: EDP Sciences: EPJ
  
Publications (18)
  
    
        
    
        
    
    
    
        
            
                
  
  Nickel coated carbon nanotubes in aluminum matrix composites: a multiscale simulation study (2019)
  Nasiri S, Wang K, Yang M, Li Q, Zaiser M
  Journal article
            
                
  
  Statistical dynamics of early creep stages in disordered materials (2019)
  Fernandez Castellanos D, Zaiser M
  Journal article
            
                
  
  Graph theoretical approaches for the characterization of damage in hierarchical materials (2019)
  Moretti P, Renner J, Safari A, Zaiser M
  Journal article
            
                
  
  Size-dependent optical absorption of Cu2ZnSn(Se,S)4 quantum dot sensitizers from ab initio many-body methods (2018)
  Koerbel S, Boulanger P, Blase X, Marques MAL, Botti S
  Journal article
            
                
  
  On the inclusion of dissipation on top of mean-field approaches (2018)
  Dinh PM, Lacombe L, Reinhard PG, Suraud E, Vincendon M
  Journal article
            
                
  
  Assessment of quality and reliability of band structures from exact-exchange-only Kohn-Sham, hybrid, and GW methods (2018)
  Trushin E, Görling A
  Journal article
            
                
  
  Dissipative quantum dynamics and optimal control using iterative time ordering: an application to superconducting qubits (2018)
  Basilewitsch D, Marder L, Koch CP
  Journal article
            
                
  
  Relative distance between tracers as a measure of diffusivity within moving aggregates (2018)
  Poenisch W, Zaburdaev V
  Journal article
            
                
  
  An efficient coarse-grained approach for the electron transport through large molecular systems under dephasing environment (2016)
  Nozaki D, Bustos-Marun R, Cattena CJ, Cuniberti G, Pastawski HM
  Journal article
            
                
  
  Advances in wide bandgap SiC for optoelectronics (2014)
  Ou H, Ou Y, Argyraki A, Schimmel S, Kaiser M, Wellmann P, Linnarsson MK, et al.
  Journal article