Sika Deutschland GmbH


Industry / private company

Location:
Rosendahl, Germany


Publications in cooperation with FAU scientists


Seifert, S., Neubauer, J., Götz-Neunhoeffer, F., & Motzet, H. (2009). Application of two-dimensional XRD for the characterization of the microstructure of self-leveling compounds. Powder Diffraction, 24(2), 107-111. https://dx.doi.org/10.1154/1.3132642

Last updated on 2018-21-12 at 10:39