Rauschert GmbH

Industry / private company


Location: Judenbach-Heinersdorf, Germany (DE) DE

ISNI: -


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Types of publications

Journal article
Book chapter / Article in edited volumes
Authored book
Translation
Thesis
Edited Volume
Conference contribution
Other publication type
Unpublished / Preprint

Publication year

From
To

Abstract

Journal

Long-Term Stability of Novel Crucible Systems for the Growth of Oxygen-Free Czochralski Silicon Crystals (2023) Sturm F, Trempa M, Schuster G, Hegermann R, Goetz P, Wagner R, Barroso G, et al. Journal article High-throughput, outdoor characterization of photovoltaic modules by moving electroluminescence measurements (2019) Doll B, Pickel T, Schreer O, Zetzmann C, Hepp J, Teubner J, Buerhop C, et al. Journal article High throughput, outdoor characterization of silicon photovoltaic modules by moving electroluminescence measurements (2018) Doll B, Pickel T, Schreer O, Zetzmann C, Teubner J, Buerhop-Lutz C, Hauch J, et al. Conference contribution, Conference Contribution Influence of the Irradiance on the Detection and Performance of PID-Affected PV-Modules (2018) Buerhop-Lutz C, Pickel T, Wenz F, Zetzmann C, Hauch J, Camus C, Brabec C Conference contribution, Abstract of a poster Impact of PID on industrial rooftop PV-installations (2017) Buerhop C, Fecher F, Pickel T, Patel T, Zetzmann C, Camus C, Hauch J, Brabec C Conference contribution, Conference Contribution Analysis of inhomogeneous local distribution of Potential induced degradation at a rooftop photovoltaic installation (2017) Buerhop C, Pickel T, Patel T, Fecher FW, Zetzmann C, Camus C, Hauch J, Brabec C Journal article, Original article Qualitative und quantitative Auswertung regelmäßig durchgeführter aIR-Inspektionen von PV-Anlagen mit typischem PID-Muster (2017) Fecher FW, Buerhop-Lutz C, Pickel T, Hundhausen M, Zetzmann C, Camus C, Hauch J, Brabec C Conference contribution, Conference Contribution Quantitative Study of Potential Induced Degradation of a Roof-Top PV-Installation with IR-Imaging (2017) Buerhop-Lutz C, Pickel T, Fecher FW, Zetzmann C, Hauch J, Camus C, Brabec C Conference contribution, Conference Contribution IR-images of PV-modules with potential induced degradation (PID) correlated to monitored string power output (2016) Buerhop C, Pickel T, Blumberg T, Adams J, Wrana S, Dalsass M, Zetzmann C, et al. Conference contribution, Conference Contribution