Normalized differential conductance to study current conduction mechanisms in MOS structures - Nouibat, T. H.; Messai, Z.; Chikouch, D.; Ouennoughi, Z.; Rouag, N.; Rommel, Mathias; Frey, Lothar (Microelectronics Reliability, 2018)
Keywords: Fowler–Nordheim; MOS device; Conduction mechanism; Poole–Frenkel; Normalized Differential Conductance (NDC); Parameter extractions