Electrical characterization of lateral 4H-SiC MOSFETs in the temperature range of 25 to 600 °C for harsh environment applications - Daves, Walter; Krauss, A.; Häublein, Volker; Bauer, Anton; Frey, Lothar (2011 IMAPS International Conference on High Temperature Electronics Network, HiTEN 2011, 2011)
Keywords: Harsh environment; 4H-SiC; MOSFET; High-temperature; Transducer