A New BIST Scheme for the DAC SNDR Testing of an Audio Chip. - Li, Hongzhi; Eckmüller, Josef; Russo, Michaela; Sattler, Sebastian; Eichfeld, Herbert; Weigel, Robert (9th International Mixed-Signal Testing Workshop, 2003)
elib2cris::1512001600,li2003b
Keywords: BIST; DAC; SNDR; audio